Digital Signal Processing for High Endurance Solid State Drives

Abstract: Building a solid state drive (SSD) to meet high endurance is a challenging task. We know that as we cycle the NAND, the raw bit error rate (RBER) increases. The channel deteriorates with the life of the drive and at the end of life (EOL) of the drive, the channel has very different characteristics compared to the beginning of life (BOL). A solution which is optimal for BOL is hence not optimal for EOL. The aim of this paper is to clarify how digital signal processing (DSP) plays a pivotal role in meeting the drive performance through the life of the drive with minimal overheads. In order to meet high endurance, the solutions adopted can be categorized in three areas. 1. DSP Schemes 2. Error Control Coding Schemes 3. Adaptive Media Management Schemes In this talk we focus on detailed methods for the above three areas.

Bio: Ravi Motwani obtained his PhD from the Indian Institute of Science, Bangalore, India in 1998. He has held research positions with Philips Research Labs., Netherlands, Broadcom Corporation and now works for the Non-Volatile Solutions Group (NSG) of Intel Corporation in Santa Clara, CA. His current focus in on developing DSP and ECC solutions for NAND Flash Memory and emerging memory technologies.